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NanoScience and Technology: Atomic Force Microscopy

Second Edition

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The book explains the operating principles of atomic force microscopy to enable readers to operate a scanning probe microscope successfully and to understand the data obtained. The chapters on the scanning probe techniques are complemented by chapters on fundamentals and important technical aspects. This book is primarily intended for graduate students in physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

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NanoScience and Technology: Atomic Force Microscopy, Bert Voigtländer

Taal
Jaar van publicatie
2019
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(Hardcover),
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Zeer goed
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€ 67,99

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Titel
NanoScience and Technology: Atomic Force Microscopy
Ondertitel
Second Edition
Taal
Engels
Uitgever
Springer
Jaar van publicatie
2019
Formaat
Hardcover
Aantal pagina's
345
ISBN10
3030136531
ISBN13
9783030136536
Reeks
Beoordeling
5 van 5
Aantekening
The book explains the operating principles of atomic force microscopy to enable readers to operate a scanning probe microscope successfully and to understand the data obtained. The chapters on the scanning probe techniques are complemented by chapters on fundamentals and important technical aspects. This book is primarily intended for graduate students in physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.