Otto Meyer Boeken

Focusing on the advancements in material analysis, this conference brought together experts from 21 countries to discuss ion beam techniques, including backscattering, channeling, and ion-induced X-rays. With 7 invited papers and 85 contributions, the event emphasized technical challenges and novel applications. Participants engaged in detailed discussions across various sessions, fostering collaboration and knowledge sharing. The proceedings include all papers presented, while summaries of discussions will be published separately, highlighting the growing importance of ion beam surface layer analysis.

Focusing on material analysis using ion beams, the conference held in Karlsruhe highlighted advanced techniques such as backscattering, channeling, and ion-induced X-rays. With 7 invited papers and 85 contributions from 150 participants across 21 countries, discussions were organized into sessions on fundamental aspects, analytical problems, and applications. This gathering underscored the growing interest and established methodologies in ion beam surface layer analysis, with proceedings documenting all contributions and summaries available separately.