Gabrie le Saucier Boeken

The introductory paper in this book gives an overview of the most significant attempts to use knowledge based systems for test and diagnosis. The overview includes: - systems which employ knowledge engineering - systems which employ frames and/or slots - systems which represent knowledge using some form of calculus - systems which attempt to imitate human expertise. Chapter I deals with test planning and text expertise, including AI aspects of designing testable chips, economic problems and the HITEST experience. Chapter II covers the most obvious application of AI techniques: knowledge based diagnosis. A survey paper looks at various systems, while the other papers report on practical experiences. Chapter III reports on rule based design verification and maintenance, the papers dealing with electrical verification of integrated circuits, board verification with an application in an industrial environment, and rule based maintenance.

Wafer Scale Integration (WSI) is approached from three angles in this proposed architectures, CAD tools, and the technology techniques required for their implementation. Some of the recent proposals for WSI architectures examined in this volume reconfigurable building blocks; reconfigurable microprocessors; systolic arrays for image processing; and parallel computing machines. The criteria of cost, performance and reliability are applied to these proposals in an attempt to select the best candidate for WSI. Fascinating technological advances for WSI, such as copper tracking and laser panthography, are also described. The second section examines basic software techniques useful for WSI (test, reconfiguration. general CAD). And the final section stresses the need to move away from "abstract" architectural discussions and base further effort in the real world.