Optoelectronic characterization of thin-film solar cells by electroreflectance and luminescence spectroscopy

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This work focuses on the application of electroreflectance spectroscopy to chalcogenide thin-film solar cells for precise determination of the absorber band gap. A proper analysis of recorded spectra is developed by using one and two-dimensional optical simulations to exclude evaluation artifacts. Furthermore, the measurement geometry is improved to suppress interference-related distortions in electroreflectance spectra of thin-film solar cells. Finally, this powerful technique is employed to study thermally-induced atomic reordering processes in thin-film absorber layers resulting in measurable band gap shifts and an increase in device efficiency.