Het boek is momenteel niet op voorraad

Meer over het boek
Focusing on advanced microscopy techniques, this book offers an in-depth exploration of reflection electron microscopy, reflection high-energy electron diffraction, and reflection electron energy-loss spectroscopy. It is structured into three parts: diffraction, imaging, and spectroscopy, integrating fundamental techniques with practical applications and experimental theories. Additionally, it provides essential reference materials, including FORTRAN source codes for crystal structure calculations, making it a valuable resource for researchers and graduate students in physics and materials science.
Een boek kopen
Reflection Electron Microscopy and Spectroscopy for Surface Analysis, Zhong Lin Wang
- Taal
- Jaar van publicatie
- 2005
- product-detail.submit-box.info.binding
- (Paperback)
Zodra we het ontdekt hebben, sturen we een e-mail.
Betaalmethoden
We missen je recensie hier.