Field-Ion Microscopy

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The Field-Ion Microscope (FIM) remains unparalleled in its ability to resolve single atoms on metal surfaces, despite advancements in microanalytical tools. Initially developed by Milller, the FIM was later combined with a time-of-flight (ToF) mass spectrometer, creating the Atom-Probe FIM, aimed at enhancing the understanding of field ionization and evaporation. Although initially limited to refractory metals, the introduction of micro-channel electron multipliers expanded its application to more common metals like iron, copper, nickel, and aluminum, significantly impacting metallurgical studies.