Proceedings: Thirteenth IEEE European Test Symposium: Ets 2008, 25-29 May 2008, Verbania, Italy

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A May 2008 symposium discussed trends, emerging results, hot topics, and practical applications in the area of electronic-based circuit and systems testing. Papers from the symposium are presented here, in sections on testing and monitoring for high-quality requirements, SoC infrastructure and testing, advances in RF testing, safe test generation and design validation, memory test, industrial applications, simulation and test generation of delay faults, on-chip resources for mixed-signal devices, solutions for yield enhancement, on-line checking, and soft error mitigation. Some specific areas described are bridge defect diagnosis for multiple-voltage design, bypassing blocking bugs during post-silicon validation, accelerated shift registers for x-tolerant test data compaction, and jitter decomposition in high-speed communication systems. There is no subject index.