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This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
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Scanning Electron Microscopy and X-Ray Microanalysis, Joseph I. Goldstein, Dale E. Newbury, David C Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda C. Sawyer, J.R. Michael
- Taal
- Jaar van publicatie
- 2003
- product-detail.submit-box.info.binding
- (Hardcover),
- Staat van het boek
- Goed
- Prijs
- € 10,49
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Nog niemand heeft beoordeeld.
- Ondertitel
- Third Edition
- Taal
- Engels
- Auteurs
- Joseph I. Goldstein, Dale E. Newbury, David C Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda C. Sawyer, J.R. Michael
- Uitgever
- Springer
- Jaar van publicatie
- 2003
- Formaat
- Hardcover
- Aantal pagina's
- 689
- ISBN10
- 0306472929
- ISBN13
- 9780306472923
- Reeks
- Tags
- Non-fictie, Studieboeken, Technologie & Industrie, Gezondheid & Medisch, Wetenschap en Wiskunde, Handleidingen en Gidsen, Overige leerboeken, Medische studies
- Aantekening
- This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.